IR-AFM-4K - Atomic Force Microscope
Cryo IR Near-Field microscopy
-Cantilever AFM
-0.48 NA focus on tip
-Independent tip and sample temperature control
-dual Z scanner (long range for offset control + short range high bandwidth for sharp sample features)
-12 sample contacts
-Piezo motor controlling fiber to cantilever
NV-AFM-4K-111T - Atomic Force Microscope
Cryo Diamond NV Center Magnetometry
-Quartz Tuning Fork (QTF) tips (not supplied)
-0.64 NA objective lens
-Independent sample temperature control
-dual Z scanner (long range for offset control + short range high bandwidth for sharp sample features)
-12 sample contacts
- XYZ nanopositioning on tip (NP-240)
- XYZ nanopositioning on sample (NP-340)
- XY and dual Z scanning on sample - Plug-and-play Quartz Tuning Fork (QTF) mounts
- Two stage QTF preamplifier with charge amplifier on each tine and differential second stage - Note: requires 3rd party NV center probes
-Controlled with RHK R9 or R10 controllers
AFM-340 - Atomic Force Microscope
Cryogenic cantilever AFM
-Sample XYZ nanopositioning (NP-340-XYZ)
-Sample Scanning XY and dual Z
-Fiber-to-cantilever piezo motor
-Optical drive
-Controlled with RHK R9 or R10 controllers
